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NEW JEOL JEM F200 is ready for operation!

We proudly announce that our new high resolution Transmission/Scanning Transmission (TEM/STEM) JEOL JEM F200, is ready for observations. This state-of-the-art microscope will broaden our Laboratory’s activities and services, in our current and future collaborations.

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New JEOL JEM F200 HRTEM/ HRSTEM electron microscope!

The day our New JEOL JEM F200 HRTEM/ HRSTEM Cold FEG electron microscope to be operational ready is approaching! Housed at Electron Microscopy Lab, Physics, AUTH, the new JEM-F200 “F2” is the only advanced analytical, high throughput 200kV S/TEM in its class to offer a Cold Field Emission Gun and dual Silicon Drift Detectors. The…

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Check our new facebook page!

Check out our new facebook page! Stay tuned for exciting announcements to come from ElMicLab team!

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European Congress & Exhibition on Advanced Materials & Processes – EUROMAT 2019

ElMicLab has actively participated in the 16th International Conference “European Congress & Exhibition on Advanced Materials & Processes – EUROMAT 2019“, held on September 1-5, in Stockholm!

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New TEM 20 megapixel camera system for HRTEM JEOL 2011!

High Resolution Transmission Electron Microscope JEOL 2011 (200KV) is now upgraded with a brand new EMSIS’ XAROSA  20 megapixel CMOS camera! The TEM CMOS camera XAROSA is an unequaled 20 megapixel CMOS image sensor that provides 30 frames per second in full resolution. Additionally, the camera comes with a fiber optical taper resulting in a…

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19th International Conference on Extended Defects in Semiconductors, EDS2018

19th International Conference on Extended Defects in Semiconductors, EDS2018

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