The day our New JEOL JEM F200 HRTEM/ HRSTEM Cold FEG electron microscope to be operational ready is approaching!
Housed at Electron Microscopy Lab, Physics, AUTH, the new JEM-F200 “F2” is the only advanced analytical, high throughput 200kV S/TEM in its class to offer a Cold Field Emission Gun and dual Silicon Drift Detectors. The ‘F2’ employs the newest in JEOL innovations in an easy-to-use, extremely stable, high resolution imaging and analytical 200kV TEM. The F2 is a multi-purpose workhorse system with advanced features not found in any other non-aberration corrected S/TEM. Check the Key Features and Specifications