Instrumentation
High Resolution TEM/STEM Microscope JEOl JEM F200 CFEG TEM/STEM (200, 80KV), with a TEM point resolution of 0.19 nm and STEM-HAADF 0.14 nm.
The microscope is equipped with:
Implemented under the EYDEP. REGION OF CENTRAL MACEDONIA, Axis: Ax01 – “Strengthening research, technological development and innovation”-“TRANSMISSION-SCANNING/TRANSMISSION ELECTRON MICROSCOPE WITH FIELD EMISSION GUN ELECTRON SOURCE” (2018-2020) |
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High Resolution Transmission Electron Microscope JEOL 2011 (200KV), with a point resolution of 0.194 nm.
The microscope is equipped with:
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High Resolution Transmission Electron Microscope JEOL 2000FX (200KV), with point resolution of 0.28 nm
The microscope is equipped with:
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Conventional Transmission Electron Microscope JEOL JEM-1010 (40-100KV), with a resolution 0.5 nm The microscope is equipped with:
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Scanning Electron Microscope JEOL JSM-6390LV (0.5-30 KV), with a resolution of 10nm
The microscope is equipped with:
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Specimen Preparation Equipment
![]() Precision Ion Polishing System Gatan (Model 691) |
![]() Leica Ultracut UCT Ultramicrotome |
![]() Leica Trimming System EM TRIM2 |
![]() Leica Glass Knifemaker EM KMR3 |
![]() SBT Slow-speed diamond wheel saw (Model 650) |
![]() SBT Lapping & Polishing Machine (Model 910) |
![]() SBT Precision Dimpling Instrument (Model 515) |
![]() Ultrasonic Cleaner |
![]() Precision Cutter Imptech pc 10 |
![]() Buehler Isomet 2000 Precision Saw |
![]() Heidolph Rotary Disc Cutter |
![]() Sybron Thermolyne 1400 Furnace |