Instrumentation
High Resolution TEM/STEM Microscope JEOl JEM F200 CFEG TEM/STEM (200, 80KV), with a TEM point resolution of 0.19 nm and STEM-HAADF 0.14 nm.
The microscope is equipped with:
Implemented under the EYDEP. REGION OF CENTRAL MACEDONIA, Axis: Ax01 – “Strengthening research, technological development and innovation”-“TRANSMISSION-SCANNING/TRANSMISSION ELECTRON MICROSCOPE WITH FIELD EMISSION GUN ELECTRON SOURCE” (2018-2020) |
|
High Resolution Transmission Electron Microscope JEOL 2011 (200KV), with a point resolution of 0.194 nm.
The microscope is equipped with:
|
|
High Resolution Transmission Electron Microscope JEOL 2000FX (200KV), with point resolution of 0.28 nm
The microscope is equipped with:
|
|
Conventional Transmission Electron Microscope JEOL JEM-1010 (40-100KV), with a resolution 0.5 nm The microscope is equipped with:
|
|
Scanning Electron Microscope JEOL JSM-6390LV (0.5-30 KV), with a resolution of 10nm
The microscope is equipped with:
|
Specimen Preparation Equipment